Anilionis, R.

• Elektronika ir Elektrotechnika Vol. 60 No. 4 (2005) - T 171 MICROELECTRONICS
  The Analysis of Quality of CMOS Technology, Covered by Silicon Nitride
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 53 No. 4 (2004) - T 171 MICROELECTRONICS
  The Analysis of Quality of Technology of Local Oxidation
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 6 No. 2 (1996) - Articles
  Akustoelektroninių įtaisų elektrodų kokybės klausimai
  Abstract
• Elektronika ir Elektrotechnika Vol. 18 No. 5 (1998) - Articles
  Transmission Characteristics of Complex Optical Junction Establishment
  Abstract
• Elektronika ir Elektrotechnika Vol. 19 No. 1 (1999) - Articles
  Quality of Metallisation of Acustoelectronic Device Transducers
  Abstract
• Elektronika ir Elektrotechnika Vol. 23 No. 5 (1999) - Articles
  Quality Control of Semiconductor Chips Gluing
  Abstract
• Elektronika ir Elektrotechnika Vol. 24 No. 1 (2000) - Articles
  Improvement of Aluminium Thin Film Quality of TV Tubes
  Abstract
• Elektronika ir Elektrotechnika Vol. 120 No. 4 (2012) - ELECTRONICS
  Modeling of Nonlinear Circuit using Volterra Series
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 106 No. 10 (2010) - MICROELECTRONICS
  Simulation of the MOS Transistors Structures Channel Technological Problems
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 104 No. 8 (2010) - MICROELECTRONICS
  Optimisation and Problems of the Channel Area Formed by Two Ion Implantations in NMOS Structures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 96 No. 8 (2009) - T 171 MICROELECTRONICS
  Thermal Oxidation Process Influence to the Three-Dimensional Integrated Structures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 57 No. 1 (2005) - T 180 TELECOMMUNICATION ENGINEERING
  Research of Non-linearity’s of Optical Communication
  Abstract
• Elektronika ir Elektrotechnika Vol. 61 No. 5 (2005) - T 171 MICROELECTRONICS
  Using LOCOS Process in a MOSS Technology
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 75 No. 3 (2007) - T 171 MICROELECTRONICS
  Thermal Oxidation in LOCOS, PBL and SWAMI Micro and Nano Structures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 69 No. 5 (2006) - T 171 MICROELECTRONICS
  Etching Process Simulation in MOS Nanoscale Structures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 76 No. 4 (2007) - T 171 MICROELECTRONICS
  Simulation of Stress Distribution in the Silicon Substrate
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 48 No. 6 (2003) - T 191 HIGH FREQUENCY TECHNOLOGY, MICROWAVES
  Daugiamodžių šviesolaidžių sujungimo nuostolių tyrimas
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 84 No. 4 (2008) - T 171 MICROELECTRONICS
  Simulation of Doped Si Oxidation in Nano-dimension Scale
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 86 No. 6 (2008) - T 171 MICROELECTRONICS
  Investigation of Etching Process in Nano Structures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 87 No. 7 (2008) - T 171 MICROELECTRONICS
  Modeling of Manufacturing Processes in EPIC Technology
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 70 No. 6 (2006) - T 171 MICROELECTRONICS
  Nanotechnology Problems using VMOS, UMOS
  Abstract  PDF