Šeinauskas, R.

• Elektronika ir Elektrotechnika Vol. 23 No. 5 (1999) - Articles
  Design Strategy of New Generation of Electronics Circuits
  Abstract
• Elektronika ir Elektrotechnika Vol. 112 No. 6 (2011) - ELECTRONICS
  Verification of Initialization Sequences for Sequential Circuits
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 103 No. 7 (2010) - SYSTEM ENGINEERING, COMPUTER TECHNOLOGY
  Circuit Reset Sequences based on Software Prototypes
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 63 No. 7 (2005) - T 170 ELECTRONICS
  Test Design for Black-Box Models
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 5 No. 1 (1996) - Articles
  Dinaminių KMOP trigerių gedimų diagnostikos ypatumai
  Abstract
• Elektronika ir Elektrotechnika Vol. 7 No. 3 (1996) - Articles
  KMOP kombinacijų schemų gedimų diagnostikos ypatumai
  Abstract
• Elektronika ir Elektrotechnika Vol. 8 No. 4 (1996) - Articles
  KMOP kombinacijų schemų loginių ir fizinių gedimų adekvatumo analizė
  Abstract
• Elektronika ir Elektrotechnika Vol. 18 No. 5 (1998) - Articles
  Analysis of Physical Level Faults of CMOS Integrated Circuits and Bonds with Higher Levels Faults
  Abstract
• Elektronika ir Elektrotechnika Vol. 109 No. 3 (2011) - ELECTRONICS
  On Delay Test Generation for Non-scan Sequential Circuits at Functional Level
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 114 No. 8 (2011) - ELECTRONICS
  An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 118 No. 2 (2012) - ELECTRONICS
  Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 91 No. 3 (2009) - T 170 ELECTRONICS
  On the Enrichment of Static Functional Test
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 74 No. 2 (2007) - T 125 AUTOMATION, ROBOTICS
  Functional Delay Test Construction Approaches
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 59 No. 3 (2005) - T 170 ELECTRONICS
  Transition Fault Coverage For Different Implementations Of The Circuit
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 66 No. 2 (2006) - T 170 ELECTRONICS
  Defining Random Search Termination Conditions
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 67 No. 3 (2006) - T 170 ELECTRONICS
  Transition Test Supplement
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 72 No. 8 (2006) - T 170 ELECTRONICS
  Functional Test Generation Procedures
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
  Testing of FPGA Logic Cells
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
  Testing of FPGA Logic Cells
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 83 No. 3 (2008) - T 170 ELECTRONICS
  Functional Test Transformation to Improve Compaction
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 105 No. 9 (2010) - ELECTRONICS
  Factor of Randomness in Functional Delay Fault Test Generation for Full Scan Circuits
  Abstract  PDF