Seinauskas, R., Lithuania
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Elektronika ir Elektrotechnika Vol. 112 No. 6 (2011) - ELECTRONICS
Verification of Initialization Sequences for Sequential Circuits
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Elektronika ir Elektrotechnika Vol. 103 No. 7 (2010) - SYSTEM ENGINEERING, COMPUTER TECHNOLOGY
Circuit Reset Sequences based on Software Prototypes
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Elektronika ir Elektrotechnika Vol. 63 No. 7 (2005) - T 170 ELECTRONICS
Test Design for Black-Box Models
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Elektronika ir Elektrotechnika Vol. 109 No. 3 (2011) - ELECTRONICS
On Delay Test Generation for Non-scan Sequential Circuits at Functional Level
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Elektronika ir Elektrotechnika Vol. 114 No. 8 (2011) - ELECTRONICS
An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits
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Elektronika ir Elektrotechnika Vol. 118 No. 2 (2012) - ELECTRONICS
Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults
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Elektronika ir Elektrotechnika Vol. 91 No. 3 (2009) - T 170 ELECTRONICS
On the Enrichment of Static Functional Test
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Elektronika ir Elektrotechnika Vol. 74 No. 2 (2007) - T 125 AUTOMATION, ROBOTICS
Functional Delay Test Construction Approaches
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Elektronika ir Elektrotechnika Vol. 59 No. 3 (2005) - T 170 ELECTRONICS
Transition Fault Coverage For Different Implementations Of The Circuit
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Elektronika ir Elektrotechnika Vol. 66 No. 2 (2006) - T 170 ELECTRONICS
Defining Random Search Termination Conditions
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Elektronika ir Elektrotechnika Vol. 67 No. 3 (2006) - T 170 ELECTRONICS
Transition Test Supplement
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Elektronika ir Elektrotechnika Vol. 72 No. 8 (2006) - T 170 ELECTRONICS
Functional Test Generation Procedures
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Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
Testing of FPGA Logic Cells
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Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
Testing of FPGA Logic Cells
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Elektronika ir Elektrotechnika Vol. 83 No. 3 (2008) - T 170 ELECTRONICS
Functional Test Transformation to Improve Compaction
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Elektronika ir Elektrotechnika Vol. 105 No. 9 (2010) - ELECTRONICS
Factor of Randomness in Functional Delay Fault Test Generation for Full Scan Circuits
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