Jusas, V.
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Elektronika ir Elektrotechnika Vol. 63 No. 7 (2005) - T 170 ELECTRONICS
Test Design for Black-Box Models
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Elektronika ir Elektrotechnika Vol. 50 No. 1 (2004) - T 170 ELECTRONICS
Testų išsamumo užtikrinimas save testuojančiose skaitmeninėse
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Elektronika ir Elektrotechnika Vol. 109 No. 3 (2011) - ELECTRONICS
On Delay Test Generation for Non-scan Sequential Circuits at Functional Level
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Elektronika ir Elektrotechnika Vol. 114 No. 8 (2011) - ELECTRONICS
An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits
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Elektronika ir Elektrotechnika Vol. 118 No. 2 (2012) - ELECTRONICS
Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults
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Elektronika ir Elektrotechnika Vol. 91 No. 3 (2009) - T 170 ELECTRONICS
On the Enrichment of Static Functional Test
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Elektronika ir Elektrotechnika Vol. 74 No. 2 (2007) - T 125 AUTOMATION, ROBOTICS
Functional Delay Test Construction Approaches
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Elektronika ir Elektrotechnika Vol. 59 No. 3 (2005) - T 170 ELECTRONICS
Transition Fault Coverage For Different Implementations Of The Circuit
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Elektronika ir Elektrotechnika Vol. 66 No. 2 (2006) - T 170 ELECTRONICS
Defining Random Search Termination Conditions
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Elektronika ir Elektrotechnika Vol. 67 No. 3 (2006) - T 170 ELECTRONICS
Transition Test Supplement
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Elektronika ir Elektrotechnika Vol. 72 No. 8 (2006) - T 170 ELECTRONICS
Functional Test Generation Procedures
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Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
Testing of FPGA Logic Cells
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Elektronika ir Elektrotechnika Vol. 56 No. 7 (2004) - T 170 ELECTRONICS
Testing of FPGA Logic Cells
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Elektronika ir Elektrotechnika Vol. 83 No. 3 (2008) - T 170 ELECTRONICS
Functional Test Transformation to Improve Compaction
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Elektronika ir Elektrotechnika Vol. 5 No. 1 (1996) - Articles
Dinaminių KMOP trigerių gedimų diagnostikos ypatumai
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Elektronika ir Elektrotechnika Vol. 113 No. 7 (2011) - ELECTRONICS
A 2-D DCT Hardware Codec based on Loeffler Algorithm
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Elektronika ir Elektrotechnika Vol. 119 No. 3 (2012) - SIGNAL TECHNOLOGY
Using Higher Order Nonlinear Operators for SVM Classification of EEG Data
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Elektronika ir Elektrotechnika Vol. 20 No. 8 (2014) - SIGNAL TECHNOLOGY
Fractional Delay Time Embedding of EEG Signals into High Dimensional Phase Space
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Elektronika ir Elektrotechnika Vol. 105 No. 9 (2010) - ELECTRONICS
Factor of Randomness in Functional Delay Fault Test Generation for Full Scan Circuits
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Elektronika ir Elektrotechnika Vol. 23 No. 5 (1999) - Articles
Design Strategy of New Generation of Electronics Circuits
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