Plasmochemical Deposition of an Ultrathin (CFx)n Film
Abstract
We present ultrathin teflon-like (CFx)n antiadhesive polymer films, deposited on silicon an polyethylentereftalate (PETF) surfaces by CF4 and C3F8 microwave discharge. The film growth phenomenon was reached by changing F/C ratio of the monomer. X-ray photoelectron spectroscopy analysis shows that polymer film presents as -CF2-CF2- junctions. Increasing deposition time, fluorinated film on PETF become ultrathin teflon-like polymer film and surface energy decreases to 42 mJ/m2.Published
1998-01-14
How to Cite
Kopustinskas, V., Grigaliunas, V., Andrulevicius, M., & Margelevicius, J. (1998). Plasmochemical Deposition of an Ultrathin (CFx)n Film. Elektronika Ir Elektrotechnika, 14(1). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/15946
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