Evaluation of Electronic Device No-Failure

Authors

  • R.J. Balaisis
  • D. Eidukas
  • D. Navikas

Abstract

There is given a survey of dynamic action influence on electronic device no-failure. Unacceptability of widespread methods of digital device no-failure evaluation is presented. There is offered more acceptable method for calculation of failure intensity of electronic device components.

Published

1997-11-28

How to Cite

Balaisis, R., Eidukas, D., & Navikas, D. (1997). Evaluation of Electronic Device No-Failure. Elektronika Ir Elektrotechnika, 13(4). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/15873

Issue

Vol. 13 No. 4 (1997)

Section

Articles

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