Evaluation of Electronic Device No-Failure

R.J. Balaisis; D. Eidukas; D. Navikas

Evaluation of Electronic Device No-Failure

Authors

R.J. Balaisis
D. Eidukas
D. Navikas

Abstract

There is given a survey of dynamic action influence on electronic device no-failure. Unacceptability of widespread methods of digital device no-failure evaluation is presented. There is offered more acceptable method for calculation of failure intensity of electronic device components.

Published

1997-11-28

Issue

Vol. 13 No. 4 (1997)

Section

Articles

License

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How to Cite

Evaluation of Electronic Device No-Failure. (1997). Elektronika Ir Elektrotechnika, 13(4). https://eejournal.ktu.lt/index.php/elt/article/view/15873