Tamosevicius, Z., Kaunas University of Technology, Lithuania
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Elektronika ir Elektrotechnika Vol. 63 No. 7 (2005) - T 171 MICROELECTRONICS
Testing of BIST Circuits
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Elektronika ir Elektrotechnika Vol. 81 No. 1 (2008) - T 120 SYSTEM ENGINEERING, COMPUTER TECHNOLOGY
The Transition Fault Model of Programmable Logic
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Elektronika ir Elektrotechnika Vol. 87 No. 7 (2008) - T 171 MICROELECTRONICS
LSFR and BIST based Delay Test for ASIC and FPGA
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Elektronika ir Elektrotechnika Vol. 113 No. 7 (2011) - ELECTRONICS
A 2-D DCT Hardware Codec based on Loeffler Algorithm
Abstract PDF