Analysis of Digital Electronic Device Reliability

Authors

  • P. Balaišis
  • D. Eidukas
  • D. Navikas
  • G. Vilutis

Abstract

There is shown difference between digital electronic device no-failure traditional calculation and exploitation results. There are signed out two areas of dynamic actions influence: ability of digital electronic device functioning and information distortion. The conception of dynamic reliability and main trend of research are formulated. Three dynamic reliability tasks groups are singled out.

Published

2000-09-19

How to Cite

Balaišis, P., Eidukas, D., Navikas, D., & Vilutis, G. (2000). Analysis of Digital Electronic Device Reliability. Elektronika Ir Elektrotechnika, 28(5). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/18279

Issue

Vol. 28 No. 5 (2000)

Section

Articles

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