Systematic Research of Electronic Device Reliability

Authors

  • P. Balaisis
  • D. Eidukas
  • D. Navikas

Abstract

There is shown whole complex of methods of electronic device properties systematic research. Research of functional reliability, reliability-price and others is singled out. Versions of possible use are shown.

Published

1997-08-28

How to Cite

Balaisis, P., Eidukas, D., & Navikas, D. (1997). Systematic Research of Electronic Device Reliability. Elektronika Ir Elektrotechnika, 12(3). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/15856

Issue

Section

Articles