Promising Method of IC Operation Speed Testing at the Production based on 3-rd Harmonic Measurement

Authors

  • A. Aulas Semiconductor Physics Institute
  • R. Vadoklis Semiconductor Physics Institute
  • V. Dangelas Semiconductor Physics Institute
  • A. Kiseliov Semiconductor Physics Institute
  • M. Chusnutdinov Semiconductor Physics Institute
  • I. Mazurkevič Semiconductor Physics Institute

Abstract

The production test and sorting of high speed communication ICs up to 10 Gb/s, is currently complicated technical task for manufacturer. The relevant IC-test deliverers often utilize the “Catalyst GIGADIG”-instrument for RF-test at high volume and low cost production. However, it’s not applicable for Rise/Fall time measurements at more than several gigabits per second, but able to ensure the productive frequency-domain test up to 6GHz of sine signal. The objective of this work is the investigation and bringing of the prompt solution on ability of non-direct frequency-domain test instead of direct Rise/Fall time measurement for sorting of communication ICs in terms of operation at max speed, such as 8-10Gbps. The intention is to help IC-manufacturers at achieving the low cost and required quality at high volume production test. Ill. 4, bibl. 3 (in English; abstracts in English, Russian and Lithuanian).

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Published

2009-07-22

How to Cite

Aulas, A., Vadoklis, R., Dangelas, V., Kiseliov, A., Chusnutdinov, M., & Mazurkevič, I. (2009). Promising Method of IC Operation Speed Testing at the Production based on 3-rd Harmonic Measurement. Elektronika Ir Elektrotechnika, 94(6), 106-108. Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/10117

Issue

Vol. 94 No. 6 (2009)

Section

T 121 SIGNAL TECHNOLOGY

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