Kaminska, M. A., Kharkov National University of Radio Electronics, Ukraine

• Elektronika ir Elektrotechnika Vol. 74 No. 2 (2007) - T 121 SIGNAL TECHNOLOGY
  Testability Analysis of the VHDL Structure for Fault Coverage Improving
  Abstract  PDF
• Elektronika ir Elektrotechnika Vol. 66 No. 2 (2006) - T 121 SIGNAL TECHNOLOGY
  Testability Analysis Approach TADATPG for Deterministic Test Generation
  Abstract  PDF