Testability Analysis of the VHDL Structure for Fault Coverage Improving

Authors

  • V. I. Hahanov Kharkov National University of Radio Electronics
  • M. A. Kaminska Kharkov National University of Radio Electronics
  • O. Lavrova Kharkov National University of Radio Electronics

Abstract

Method of digital device testability analysis, which is represented on the system level (VHDL description) for verification and test synthesis tasks simplification for fault coverage improvement on the given test patterns is offered. Method is based on the topological analysis of circuit, which is represented as RTL blocks and circuit’s further modification by separation of testing and functional procedures for testability improving and testing procedure simplification. Ill. 4, bibl. 12 (in English; summaries in English, Russian and Lithuanian).

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Published

2007-02-01

How to Cite

Hahanov, V. I., Kaminska, M. A., & Lavrova, O. (2007). Testability Analysis of the VHDL Structure for Fault Coverage Improving. Elektronika Ir Elektrotechnika, 74(2), 29-32. Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/10359

Issue

Vol. 74 No. 2 (2007)

Section

T 121 SIGNAL TECHNOLOGY

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