Testability Analysis Approach TADATPG for Deterministic Test Generation

E. N. Kulak; M. A. Kaminska; O. A. Guz; O. N. Parfentiy

Testability Analysis Approach TADATPG for Deterministic Test Generation

Authors

E. N. Kulak Kharkov National University of Radio Electronics
M. A. Kaminska Kharkov National University of Radio Electronics
O. A. Guz Kharkov National University of Radio Electronics
O. N. Parfentiy Kharkov National University of Radio Electronics

Abstract

Method of testability analysis of digital circuits for deterministic test is offered. This approach is more suitable in comparison with existent classical methods. It is oriented to combinational and sequential circuits and based on topological analysis in gate level. The strategy of circuit’s modification for improvement of fault coverage is proposed. Ill. 10, bibl. 16 (in English; summaries in English, Russian and Lithuanian).

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Published

2006-02-01

Issue

Vol. 66 No. 2 (2006)

Section

T 121 SIGNAL TECHNOLOGY

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How to Cite

Testability Analysis Approach TADATPG for Deterministic Test Generation. (2006). Elektronika Ir Elektrotechnika, 66(2), 11-16. https://eejournal.ktu.lt/index.php/elt/article/view/10579