Influence of Emitted Electrons on the Method for Direct Measurement of Condensate Resistance

Authors

  • T. Jukna Kaunas University of Technology
  • V. Sinkevicius Kaunas University of Technology
  • L. Urbanaviciute Panevezys College

DOI:

https://doi.org/10.5755/j01.eee.20.2.6379

Keywords:

Thin film devices, vacuum technology, electrical resistance measurement

Abstract

Electrical resistance of the vacuum-deposited condensate has non-linear relation to the condensate film thickness. Therefore, there exists a need for experiments to study applicability of the non-invasive method for condensate resistance measurement and to identify parameters by measuring condensate resistance directly. By using two-point measurement probes, this study analyses the influence of electrons emitted in the process of evaporator electronic emission on the method for direct measurement of condensate resistance.

DOI: http://dx.doi.org/10.5755/j01.eee.20.2.6379

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Published

2014-02-05

How to Cite

Jukna, T., Sinkevicius, V., & Urbanaviciute, L. (2014). Influence of Emitted Electrons on the Method for Direct Measurement of Condensate Resistance. Elektronika Ir Elektrotechnika, 20(2), 28-31. https://doi.org/10.5755/j01.eee.20.2.6379

Issue

Vol. 20 No. 2 (2014)

Section

ELECTRONIC MEASUREMENTS

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