Immunity of Residual Current Devices to the Impulse Leakage Current in Circuits with Variable Speed Drives

Authors

  • S. Czapp Gdansk University of Technology
  • K. Borowski Gdansk University of Technology

DOI:

https://doi.org/10.5755/j01.eee.19.8.2883

Keywords:

power installations, reliability of supply, residual current devices, variable speed drives

Abstract

This paper concerns reliability of supply in variable speed drives circuits with residual current devices. During normal operation of these circuits high value of leakage current causes unwanted tripping of residual current devices. Immunity of residual current devices to the impulse leakage current should be evaluated. The system for testing of residual current devices and results of the test are presented.

DOI: http://dx.doi.org/10.5755/j01.eee.19.8.2883

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Published

2013-09-26

How to Cite

Czapp, S., & Borowski, K. (2013). Immunity of Residual Current Devices to the Impulse Leakage Current in Circuits with Variable Speed Drives. Elektronika Ir Elektrotechnika, 19(8), 15-18. https://doi.org/10.5755/j01.eee.19.8.2883

Issue

Vol. 19 No. 8 (2013)

Section

ELECTRICAL ENGINEERING

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