Quality Level Linear Models Electronic Systems
AbstractContinuous control main probability characteristic modeling methods for ES has been made, when separate independent device parameters defect level probabilistic distributions are “a priori” known. Defected devices flow in control operation is targeted to localized repair operation in this stage, then ES with second type errors goes again into control and “rotates” until all devices are accepted as good. Second type classification errors probabilities in control and repair operations are described by one generalized error model, which is used in linear defect level transformation by different parameters. For all defect level transformation, defect levels densities by different parameters combination, is used referencing by transformation model. It is offered to use approximated models instead of exact whole ES defect level probabilistic density by different parameters, described by beta law density. This method simplifies modeling procedure, without decreasing engineering analysis accuracy. Ill. 4, bibl. 6, tabl. 3 (in English; abstracts in English and Lithuanian).
How to Cite
The copyright for the paper in this journal is retained by the author(s) with the first publication right granted to the journal. The authors agree to the Creative Commons Attribution 4.0 (CC BY 4.0) agreement under which the paper in the Journal is licensed.
By virtue of their appearance in this open access journal, papers are free to use with proper attribution in educational and other non-commercial settings with an acknowledgement of the initial publication in the journal.