The Testing Methods of Programmable Integrated Circuits

Authors

  • V. Abraitis Kaunas University of Technology
  • E. Bareiša Kaunas University of Technology
  • R. Benisevičiūtė Kaunas University of Technology

Abstract

In this paper the types of structures of programmable integrated circuits (FPGA), their possibilities, advantages and faults are considered. The fault models of programmable integrated circuits are analyzed, when programmable integrated circuits are configured to implement a given application. Proposed fault model can be used with traditionally automatic test sequence generators. The results of experiment show that for different synthesis of the same circuit we need different test sequences. Ill. 4, bibl. 15 (in Lithuanian; summaries in Lithuanian, English and Russian).

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Published

2003-08-20

How to Cite

Abraitis, V., Bareiša, E., & Benisevičiūtė, R. (2003). The Testing Methods of Programmable Integrated Circuits. Elektronika Ir Elektrotechnika, 47(5). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/11240

Issue

Vol. 47 No. 5 (2003)

Section

T 171 MICROELECTRONICS

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