Motiejunas, L., Kaunas University of Technology, Lithuania
-
Elektronika ir Elektrotechnika Vol. 118 No. 2 (2012) - ELECTRONICS
Application of Preselection of Test Subsequences in Sequential Test Generation for Functional Delay Faults
Abstract PDF -
Elektronika ir Elektrotechnika Vol. 105 No. 9 (2010) - ELECTRONICS
Factor of Randomness in Functional Delay Fault Test Generation for Full Scan Circuits
Abstract PDF