Temperature Influence Analysis on the Selected Current Sources Stability in the Static and Dynamic Operating States

Authors

  • Wojciech Walendziuk
  • Adam Idzkowski
  • Jerzy Golebiowski
  • Pawel Swietochowski

DOI:

https://doi.org/10.5755/j01.eie.23.2.17998

Keywords:

Current source, temperature test, Grubbs test, Shapiro-Wilk test

Abstract

The present work contains the stability test results of the current sources located in an environment of variable temperature. Two types of tests were conducted  for four circuits stabilizing the current of the value close to 50 mA. One test consisted in changing the temperature in which the current sources loaded with variable resistance were placed. The other test related to the analysis of the transient state during switching on and off the load for two values of temperature. The article presents the obtained results of experiments and discusses the reasons of the measurement errors.

DOI: http://dx.doi.org/10.5755/j01.eie.23.2.17998

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Published

2017-04-20

How to Cite

Walendziuk, W., Idzkowski, A., Golebiowski, J., & Swietochowski, P. (2017). Temperature Influence Analysis on the Selected Current Sources Stability in the Static and Dynamic Operating States. Elektronika Ir Elektrotechnika, 23(2), 40-46. https://doi.org/10.5755/j01.eie.23.2.17998

Issue

Vol. 23 No. 2 (2017)

Section

ELECTRONICS

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