Multiparametrical Electronic Device Control

Authors

  • R. Kalnius
  • J. Kruopis

Abstract

There is analysed influence of multiparametrical electronic device control with classification mistakes on the quality level after control. The probability models of multiparametrical electronic device control are created.

Published

1999-03-07

How to Cite

Kalnius, R., & Kruopis, J. (1999). Multiparametrical Electronic Device Control. Elektronika Ir Elektrotechnika, 20(2). Retrieved from https://eejournal.ktu.lt/index.php/elt/article/view/16489

Issue

Section

Articles