Immunity of Residual Current Devices to the Impulse Leakage Current in Circuits with Variable Speed Drives

S. Czapp, K. Borowski

Abstract


This paper concerns reliability of supply in variable speed drives circuits with residual current devices. During normal operation of these circuits high value of leakage current causes unwanted tripping of residual current devices. Immunity of residual current devices to the impulse leakage current should be evaluated. The system for testing of residual current devices and results of the test are presented.

DOI: http://dx.doi.org/10.5755/j01.eee.19.8.2883


Keywords


power installations; reliability of supply; residual current devices; variable speed drives

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Print ISSN: 1392-1215
Online ISSN: 2029-5731