Levulienė, R., Vilnius University, Lithuania
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Elektronika ir Elektrotechnika Vol. 93 No. 5 (2009) - T 170 ELECTRONICS
Reliability Estimation when Failure Intensity Depends on Calendar Time
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Elektronika ir Elektrotechnika Vol. 61 No. 5 (2005) - T 170 ELECTRONICS
Kinescope Classification using Mathematical Statistics Methods
Abstract PDF
