Ullah, Naqeeb, School of Optics and Photonics, Beijing Institute of Technology, China, China

• Elektronika ir Elektrotechnika Vol. 28 No. 2 (2022) - MICRO-, NANOELECTRONICS
  Investigation of Leakage Current in Micro M-I-M Structure Using Multilayer High-K Dielectric Materials with COMSOL Multiphysics
  Abstract  PDF