Gurjar, Devendra S., Department of Electronics and Communications Engineering, National Institute of Technology Silchar, Assam, India, India

• Elektronika ir Elektrotechnika Vol. 29 No. 3 (2023) - TELECOMMUNICATIONS ENGINEERING
  Using Level Crossing Rate of Selection Combining Receiver Damaged by Beaulieu-Xie Fading and Rician Co-Channel Interference with a Purpose of Machine Learning QoS Level Prediction
  Abstract  PDF