Statistically Biased Calibration Method for the Real-time Adjustment of Noninvasive Haemoglobin Measurements in a Semi-automated Infusion System

Authors

  • V. Markevičius Kaunas University of Technology
  • A. Andrijauskas Vilnius University Clinic of Anaesthesiology and Intensive Care
  • D. Navikas Kaunas University of Technology
  • C. Svensen Karolinska Institutet, Södersjukhuset
  • N. Porvaneckas Vilnius University Faculty of Medicine
  • D. Andriukaitis Kaunas University of Technology
  • G. Kvederas Kaunas University of Technology
  • D. Cincikas Vilnius University Clinic of Anaesthesiology and Intensive Care
  • P. Andrijauskas Lithuanian University of Health Sciences

DOI:

https://doi.org/10.5755/j01.eee.19.7.5165

Keywords:

Haemoglobin concentration, noninvasive haemoglobin measurements, perfusion index, haemodilution, closed loop system, control equipment, centralised control

Abstract

Closed loop systems are the ultimate solution to ensure that optimal therapies are delivered in a timely manner. A concept of a semi-closed loop infusion system for perioperative semi-automated optimisation of blood pressure and haemodilution is proposed. The key variable for the latter objective is the noninvasively and continuously measured blood haemoglobin concentration. However, it lacks reliability in predicting the haemoglobin in large blood vessels. Our proposed statistically biased calibration method for the adjustment of noninvasively measured Hb enabled better prediction of arterial Hb when it was applied to data from our ongoing clinical trial.

DOI: http://dx.doi.org/10.5755/j01.eee.19.7.5165

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Published

2013-09-09

How to Cite

Markevičius, V., Andrijauskas, A., Navikas, D., Svensen, C., Porvaneckas, N., Andriukaitis, D., Kvederas, G., Cincikas, D., & Andrijauskas, P. (2013). Statistically Biased Calibration Method for the Real-time Adjustment of Noninvasive Haemoglobin Measurements in a Semi-automated Infusion System. Elektronika Ir Elektrotechnika, 19(7), 65-71. https://doi.org/10.5755/j01.eee.19.7.5165

Issue

Vol. 19 No. 7 (2013)

Section

ELECTRONICS

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