Research of Condensate Resistance Measurement Using Single-Contact Substrate

Authors

  • Tomas Jukna Kaunas University of Technology
  • Vytenis Sinkevicius
  • Lina Urbanaviciute
  • Jonas Valickas

DOI:

https://doi.org/10.5755/j01.eee.22.1.14107

Keywords:

Thin film devices, vacuum technology, electrical resistance measurement

Abstract

The research of non-invasive method for condensate resistance measurement uses a substrate with a single-contact area. The novelty of this measurement method lies in the use of electrical current of electrons emitted during the process of electronic emission from an evaporator. Therefore, there is no need of any additional current or voltage source. This study develops a mathematical model describing the performance and dependencies of this method of measurement. The adequacy of this mathematical model was investigated experimentally. For this purpose, the results of direct measurement of substrate condensate resistance were used.

DOI: http://dx.doi.org/10.5755/j01.eee.22.1.14107

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Published

2016-02-05

How to Cite

Jukna, T., Sinkevicius, V., Urbanaviciute, L., & Valickas, J. (2016). Research of Condensate Resistance Measurement Using Single-Contact Substrate. Elektronika Ir Elektrotechnika, 22(1), 31-35. https://doi.org/10.5755/j01.eee.22.1.14107

Issue

Vol. 22 No. 1 (2016)

Section

ELECTRICAL ENGINEERING

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