March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories

Authors

  • C. Huzum "Gheorghe Asachi" Technical University of Iași
  • P. Cascaval "Gheorghe Asachi" Technical University of Iași

DOI:

https://doi.org/10.5755/j01.eee.119.3.1369

Abstract

A multibackground March test (March-76N) for a model of static neighborhood pattern sensitive faults (NPSFs) in N ´ 1 random-access memories is presented. March-76N is able to cover both simple and linked NPSFs. As any other test dedicated to the NPSFs, March-76N assumes that the storage cells are arranged in a rectangular grid and the mapping from logical addresses to physical cell locations is known completely. With a length of 76N, this March test is more efficient than other published tests dedicated to this model. Ill. 4, bibl. 16, tabl. 4 (in English; abstracts in English and Lithuanian).

DOI: http://dx.doi.org/10.5755/j01.eee.119.3.1369

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Published

2012-03-14

How to Cite

Huzum, C., & Cascaval, P. (2012). March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories. Elektronika Ir Elektrotechnika, 119(3), 81-86. https://doi.org/10.5755/j01.eee.119.3.1369

Issue

Vol. 119 No. 3 (2012)

Section

SYSTEM ENGINEERING, COMPUTER TECHNOLOGY

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