Computer Controlled Thermostat for the Resistivity measurements of the La1-xSrxMnO3 thin films

Authors

  • T. Stankevic Semiconductor Physics Institute
  • V. Stankevic Semiconductor Physics Institute
  • D. Pavilonis Semiconductor Physics Institute
  • N. Zurauskiene Semiconductor Physics Institute
  • J. Novickij Vilnius Gediminas Technical University
  • S. Tolvaisiene Vilnius Gediminas Technical University

DOI:

https://doi.org/10.5755/j01.eee.119.3.1363

Abstract

The temperature stabilization system for the magnetoresistance measurements of the La1-xSrxMnO3 manganites is described in this paper. The thermostat cell with the Peltier heating/cooling element was manufactured specially to be placed between the poles of the electromagnet. The heat sink attached to the rear side of the Peltier element is cooled by the flowing tap water. Platinum film temperature probe was used for the temperature feedback signal. Universal multimeter “Tektronix DMM 4050” was used as a temperature meter and a regulated laboratory power supply “TTI QL 564P” was used to supply the current through the Peltier element. Both instruments were controlled by the computer software via the USB and GPIB interfaces. The software implementing a PID algorithm was written in the LabView graphical programming interface. The results show that the temperature of the sample can be changed in 2-3 minutes depending on the temperature step and is kept constant with precision of 0.02 °C. Ill. 8, bibl. 8 (in English; abstracts in English and Lithuanian).

DOI: http://dx.doi.org/10.5755/j01.eee.119.3.1363

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Published

2012-03-14

How to Cite

Stankevic, T., Stankevic, V., Pavilonis, D., Zurauskiene, N., Novickij, J., & Tolvaisiene, S. (2012). Computer Controlled Thermostat for the Resistivity measurements of the La1-xSrxMnO3 thin films. Elektronika Ir Elektrotechnika, 119(3), 53-56. https://doi.org/10.5755/j01.eee.119.3.1363

Issue

Vol. 119 No. 3 (2012)

Section

ELECTRONICS

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