Statistical Evaluation of No-Failure and Efficiency of Electronic Devices
Statistical reliability evaluation problem for electronic devices (ED) was based. Problem of formulating statistical criterion calculation method was formed. Statistical interpretation of impact set was performed. For this reason short-term random impacts were selected, which also have random values of indexes. Statistical method for ED failure prognostication was presented. Calculations of probabilities for separate impact classes were calculated. Statistical evaluation of ED incorruptibility and efficiency possibility in unintended environment were analysed, using stochastic incorruptibility evaluation method. Ill. 9, bibl. 3 (in Lithuanian; summaries in Lithuanian, Russian and English).
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