Propagation Delay Times Measurements of High-speed Digital ICs


  • V. Kvedaras Vilnius Gediminas Technical University
  • R. Kvedaras Vilnius Gediminas Technical University
  • Z. Jankauskas Vilnius Gediminas Technical University


The new tester for the measurement of the propagation delay times in high-speed digital IC by the use of multi-channel samplehead is considered. The multi-channel sample converter is a rather simple device with a small level of internal noise and was developedon the basis of peak detecting sample converter with two quartz generators. The two models of the tester is developed and researched. Intesters frequency of recurrence the test pulses the equal 10 MHz, measured times of delays of distribution 0,5 – 50 nanoseconds isestablished. Time of measurement of one IC makes 0,2 – 1,5 s and depends on amount of measured parameters, and can be reduced upto 10 times. Experimental researches of testers have shown good characteristics of accuracy of measurement, shot-time and long-timestability of results of measurement. The measurement error of propagation delay times does not exceed ± 5%. Time of measurement ofone parameter makes 50 ms, without consideration installation time IC. Ill.5, bibl.5 (in English; summaries in Lithuanian, English andRussian).




How to Cite

Kvedaras, V., Kvedaras, R., & Jankauskas, Z. (2004). Propagation Delay Times Measurements of High-speed Digital ICs. Elektronika Ir Elektrotechnika, 56(7). Retrieved from