Leakage Current Compensation for the 0.13 μm CMOS Charge Sensitive Preamplifier
Abstract
We have been simulated the submicron CMOS charge sensitive preamplifier (CSP) with the leakage current compensation circuit, which allows reducing equivalent noise charge up to 54 electrons. Simulation has been performed with SPICE simulators using the BSIMV3.3 transistors parameters of the MOSIS 0.13 μm CMOS. The value of the feedback capacitor Cfb is chosen as the CGD≈1 fF capacitance of input transistors. The feedback resistance Rfb is implemented by PMOS transistors operating in the linear region. CSP has the following main electrical parameters: the minimum of ENC is in the leakage current region -3 nA…+6 nA and equal 54…70 ē, total gain of the chain is K=41.42 mV/kē, while the peaking time is τp≈35 ns. It is a promising solution for X-ray pixel detectors. Ill. 7, bibl. 10 (in English; summaries in English, Russian and Lithuanian).
Downloads
Published
How to Cite
Issue
Section
License
The copyright for the paper in this journal is retained by the author(s) with the first publication right granted to the journal. The authors agree to the Creative Commons Attribution 4.0 (CC BY 4.0) agreement under which the paper in the Journal is licensed.
By virtue of their appearance in this open access journal, papers are free to use with proper attribution in educational and other non-commercial settings with an acknowledgement of the initial publication in the journal.