Analysis of Digital Electronic Device Reliability

  • P. Balaišis Kauno technologijos universitetas
  • D. Eidukas
  • D. Navikas
  • G. Vilutis

Abstract

There is shown difference between digital electronic device no-failure traditional calculation and exploitation results. There are signed out two areas of dynamic actions influence: ability of digital electronic device functioning and information distortion. The conception of dynamic reliability and main trend of research are formulated. Three dynamic reliability tasks groups are singled out.
Published
2000-09-19
How to Cite
Balaišis, P., Eidukas, D., Navikas, D., & Vilutis, G. (2000). Analysis of Digital Electronic Device Reliability. Elektronika Ir Elektrotechnika, 28(5). Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/18279
Section
Articles