Analysis of Digital Electronic Device Reliability

P. Balaišis, D. Eidukas, D. Navikas, G. Vilutis

Abstract


There is shown difference between digital electronic device no-failure traditional calculation and exploitation results. There are signed out two areas of dynamic actions influence: ability of digital electronic device functioning and information distortion. The conception of dynamic reliability and main trend of research are formulated. Three dynamic reliability tasks groups are singled out.

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Print ISSN: 1392-1215
Online ISSN: 2029-5731