Test Design for Black-Box Models
Microelectronic circuits are becoming more complex and their testing is more and more complex and expensive. If errors are detected early it is cheaper to correct them. Only high abstraction level models are available at early project stages. High level model is viewed as “black-box” in our research, not looking to its internal design. Algorithms used are based on simulation techniques and are independent of design environment. It is attempted to create test sequence, which be usable in early project stages, and later to adopt it to particular requirements. Experiments show that obtained sequences are shorter than random generated, but have similar test quality. Ill. 3, bibl. 7 (In Lithuanian; summaries in Lithuanian, English, Russian).
Authors retain copyright and grant the journal the right of the first publication with the paper simultaneously licensed under the Creative Commons Attribution 4.0 (CC BY 4.0) licence.
Authors are allowed to enter into separate, additional contractual arrangements for the non-exclusive distribution of the paper published in the journal with an acknowledgement of the initial publication in the journal.
Copyright terms are indicated in the Republic of Lithuania Law on Copyright and Related Rights, Articles 4-37.