Beddiaf A, Medjaldi M, Djamai D, Lanani A. Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model. ELEKTRON ELEKTROTECH [Internet]. 2025 Oct. 31 [cited 2026 Mar. 20];31(5):35-40. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/39263