Špánik P, Dobrucký B, Frívaldský M, Drgoňa P, Kurytnik I. Measurement of swtitching losses in power transistor structure. ELEKTRON ELEKTROTECH [Internet]. 2008 Feb. 1 [cited 2026 Feb. 8];82(2):75-8. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/11059