R. Balaisis, D. Eidukas, and D. Navikas, “Evaluation of Electronic Device No-Failure”, ELEKTRON ELEKTROTECH, vol. 13, no. 4, Nov. 1997, Accessed: Jan. 23, 2026. [Online]. Available: https://eejournal.ktu.lt/index.php/elt/article/view/15873