BEDDIAF, Abdelaziz; MEDJALDI, Malika; DJAMAI, Djemouai; LANANI, Abderrahim. Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model. Elektronika ir Elektrotechnika, [S. l.], v. 31, n. 5, p. 35–40, 2025. DOI: 10.5755/j02.eie.39263. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/39263.. Acesso em: 20 mar. 2026.