Analysis of Physical Level Faults of CMOS Integrated Circuits and Bonds with Higher Levels Faults. Elektronika ir Elektrotechnika, [S. l.], v. 18, n. 5, 1998. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/16035.. Acesso em: 5 dec. 2025.