ŠPÁNIK, P.; DOBRUCKÝ, B.; FRÍVALDSKÝ, M.; DRGOŇA, P.; KURYTNIK, I. Measurement of swtitching losses in power transistor structure. Elektronika ir Elektrotechnika, [S. l.], v. 82, n. 2, p. 75–78, 2008. DOI: 10.5755/j02.eie.11059. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/11059.. Acesso em: 11 jun. 2026.