BAGDANAVIČIUS, N.; ŽICKIS, A.; BARYSAITĖ, I. Statistical Evaluation of No-Failure and Efficiency of Electronic Devices. Elektronika ir Elektrotechnika, [S. l.], v. 53, n. 4, 2004. DOI: 10.5755/j02.eie.10899. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10899.. Acesso em: 24 may. 2026.