Testability Analysis Approach TADATPG for Deterministic Test Generation. Elektronika ir Elektrotechnika, [S. l.], v. 66, n. 2, p. 11–16, 2006. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/10579.. Acesso em: 5 dec. 2025.