Factor of Randomness in Functional Delay Fault Test Generation for Full Scan Circuits. Elektronika ir Elektrotechnika, [S. l.], v. 105, n. 9, p. 39–42, 2010. Disponível em: https://eejournal.ktu.lt/index.php/elt/article/view/9165.. Acesso em: 5 dec. 2025.