Probabilistic-based Defect/Fault Characterisation of Complex Gates from Standard Cell Library

  • M. B. Blyzniuk
  • I. Y. Kazymyra Lviv Polytechnic National University

Abstract

The process of probabilistic-based defect/fault characterisation of complex gates from industrial cell library is considered. The aimof defect/fault characterisation is the realistic representation of physical defects influence on gate behaviour in fault models. Thecharacterisation process is focused on the precise analysis of gate layout geometry, defect size distribution, and density of physicaldefects, on careful identification of real faulty function from actual behaviour of failure circuit, and on test-based fault characterisationfor finding the best sequence of test patterns for all faults detecting. The description of cell-oriented software FIESTA-EXTRA for theautomation of the process of gates defect/fault characterisation is presented. The obtained results of gates characterisation fromindustrial standard cell library in 0.8 μm CMOS technology are analysed. Ill. 7, bibl. 17 (in English; summaries in Lithuanian, English,Russian).

Published
2004-03-19
How to Cite
Blyzniuk, M. B., & Kazymyra, I. Y. (2004). Probabilistic-based Defect/Fault Characterisation of Complex Gates from Standard Cell Library. Elektronika Ir Elektrotechnika, 52(3). Retrieved from http://eejournal.ktu.lt/index.php/elt/article/view/10918
Section
T 170 ELECTRONICS