1.
Bareisa E, Jusas V, Motiejunas K, Seinauskas R. An Investigation of Possibilities of Improving Random Test Generation for Non-scan Sequential Circuits. ELEKTRON ELEKTROTECH [Internet]. 2011Oct.21 [cited 2024Oct.6];114(8):11-5. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/685