1.
BulbenkienÄ— V, PÅ«ras R, Sakalauskas S. Analysis of Surface Microdefects Localization Possibilities. ELEKTRON ELEKTROTECH [Internet]. 2006Jul.22 [cited 2024Feb.22];70(6):87-90. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/10699