1.
Hahanov VI, Kaminska MA, Lavrova O. Testability Analysis of the VHDL Structure for Fault Coverage Improving. ELEKTRON ELEKTROTECH [Internet]. 2007Feb.1 [cited 2024Oct.12];74(2):29-32. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/10359