Seinauskas R, Cvirka R, Rudzioniene G. Acceleration of Fault Simulation based on a Separate List of Faults for each Test Pattern. ELEKTRON ELEKTROTECH [Internet]. 2015May28 [cited 2024Dec.4];21(3):62-5. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/5774