Faraz SM, Jafri SR un N, Tajvar Z, Alvi N ul H, Wahab Q- ul, Nur O. Effect of Annealing Atmosphere on the Diode Behaviour of ZnO/Si Heterojunction. ELEKTRON ELEKTROTECH [Internet]. 2021Aug.17 [cited 2024Dec.27];27(4):49-54. Available from: https://eejournal.ktu.lt/index.php/elt/article/view/28723