1.
BalaiĊĦis P, Eidukas D, Navikas D, Vilutis G. Research of Action Influence to Digital Electronic Device No-failure. ELEKTRON ELEKTROTECH [Internet]. 2000Aug.20 [cited 2024Nov.24];27(4). Available from: https://eejournal.ktu.lt/index.php/elt/article/view/16866